https://github.com/bamresearch/roughness-analysis-by-electron-microscopy

Roughness analysis approach by electron microscopy for spherical microparticles

https://github.com/bamresearch/roughness-analysis-by-electron-microscopy

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Roughness analysis approach by electron microscopy for spherical microparticles

Basic Info
  • Host: GitHub
  • Owner: BAMresearch
  • Language: Python
  • Default Branch: main
  • Homepage:
  • Size: 2.18 MB
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Created over 4 years ago · Last pushed over 4 years ago

https://github.com/BAMresearch/Roughness-Analysis-by-Electron-Microscopy/blob/main/

# Roughness-Analysis-by-Electron-Microscopy
Roughness analysis approach by electron microscopy for spherical microparticles

The python script in this repository accompanies the following publication:

Hlag, D., Tobias, C., Climent, E., Gojani, A., Rurack, K., Hodoroaba, V.-D., Generalized analysis approach of the profile roughness by electron microscopy with the example of hierarchically grown polystyrene-iron oxide silica core-shell-shell particles. Advanced Engineering Materials, 2022.
DOI: 10.1002/adem.202101344

If you use the code in your own work, please cite the above article.

# How to use the code:
 Download PyCharm (PyCharm Community Edition 2020.2 x64) software on your computer.

 Download the python script from the GitHub repository.

 Copy the EM images that you want to evaluate into the folder where you downloaded the python script as xxxx.tif.

![image](https://github.com/BAMresearch/Roughness-Analysis-by-Electron-Microscopy/assets/91262053/2e3f4812-4202-4b63-8c03-5542d08fd7f5)

 In the python script, enter the name of the EM image file. The script detects itself whether it is an SEM, TEM, or TSEM image.

![image](https://github.com/BAMresearch/Roughness-Analysis-by-Electron-Microscopy/assets/91262053/7c5a0951-f772-4b57-a458-d8d3649e4898)

 In the python script, enter the resolution of the EM image. 

 Press the run button. 

 The python script will output 6 files per each evaluated EM image:

    - Threshold image: xxxx_IsoData_threshold.tif

    - Border detected: xxxx_border.png 

    - Optimized center: xxxx_optimized_center.png

    - Distribution of distances as histogram: xxxx_distance_distribution.png

    - Distribution of distances as a function of angles: xxxx_angles_and_distance.png

    - Distribution of distances as a function of angles in a csv file: xxxx_angles_and_distance.csv

![image](https://github.com/BAMresearch/Roughness-Analysis-by-Electron-Microscopy/assets/91262053/a1c89bbf-7e60-418f-9fb0-f1e28b16878f)

	The final outcome of the python script is provide in the Terminal section of the PyCharm software.

	Roughness value of the single particle is provided as Roughness is XX.XX in nm.

![image](https://github.com/BAMresearch/Roughness-Analysis-by-Electron-Microscopy/assets/91262053/03b89940-3b61-452f-92e1-2f184bb88fbd)

Owner

  • Name: Bundesanstalt für Materialforschung und -prüfung
  • Login: BAMresearch
  • Kind: organization
  • Email: oss@bam.de
  • Location: Berlin/Germany

German Federal scientific research institute for materials testing and research

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